Product Specification
JLM | |
New | |
YES |
Product Descriptions
A manual microscope with episcopic/diascopic illumination, which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before mean superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm
Key benefits
- Modularized microscope body applicable with various observations and tasks
- Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
- Easy digital imaging
- for more information please visit :
- http://www.nikonmetrology.com/en_EU/Products/Microscope-Systems/Upright-Microscopes/Eclipse-LV100ND