Safe and secure payments using Abraa safe trade systems Product Specification
| Brand | JLM |
| Condition | New |
| Warranty | YES |
Product Descriptions
Key Features :
High performance system in a compact, innovative model
- Well focused high resolution morphological observation
- Secondary electron as well as Backscattered electron imaging for compositional distribution
- Selectable accelerating voltages
- High and Low vacuum operation
Compact, light, and energy saving
- Compact body equal to an optical microscope
- Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
- Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA
New capabilities for imaging
- Secondary electron imaging and backscattered electron imaging supported at high vacuum
- New high sensitivity solid state backscatter electron detector provides both composition and topographic imaging information
- Dual frame imaging to facilitate comparison of live and retrieved images
Enhanced low vacuum capability
- New solid state backscattered electron detector
- Easy observation of non conductive samples in the direct low vacuum mode
- Only 2 minutes 30 seconds from sample loading to imaging
Simple operation
- Easy touch panel operation
- A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
- Easy, dependable auto gun alignment (filament centering)
Tilt/rotation motor drive holder
The tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.
Optional accessories
Energy dispersive X-ray spectrometer
Energy dispersive X-ray spectrometer (EDS) for elemental analysis
JEOL's proprietary EDS
Quick, reliable customer support guarantees satisfaction
*This option is retrofittable
For More Information Please Visit :
http://www.nikonmetrology.com/Products/Microscope-Systems/Scanning-Electron-Microscope/JCM-6000Plus-Neoscope-Scanning-Electron-Microscope
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