A powerful yet economic benchtop scanning electron microscope from Nikon and JEOL.
As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM.
High performance system in a compact, innovative model
Intuitive touch panel operation with new GUI
Well focused 3D morphological observation
Backscattered electron imaging for compositional distribution
Metrology supported
Imaging of tilted, rotated samples (Optional)
New capabilities for imaging
Secondary electron imaging and backscattered electron imaging supported at high vacuum
Dual frame imaging to facilitate comparison of live and retrieved images
A wide magnification range from the lowest 10x for wide area of view up to 60,000x
Enhanced low vacuum capability
Enhanced quality of backscattered electron images
Easy observation of non conductive samples in the direct low vacuum mode
Only 2 minutes 30 seconds from sample loading to imaging
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